基本信息出版社：Academic Press
页码：318 页
出版日期：2006年11月
ISBN：0123705991
条形码：9780123705990
装帧：平装
正文语种：英语
内容简介 在线阅读本书
The Second Edition will continue this tradition of better preparing researchers in the basics of pharmacology. In addition, new human interest material including historical facts in pharmacology will be added. A new section on therapeutics will help readers identify with diseases and drug treatments.
*Over 30 new figures and tables
*More human interest information to provide readers with historical facts on pharmacology research
*New section on therapeutics to help identify diseaes and drug treatments
*New section on new biological concepts relevant to pharmacological research (i.e., systems biology)
*New study sections organized with ASPET and other international pharmacology organizations
*New coverage of pharmacokinetics and drug disposition
作者简介 By Terry Kenakin, GlaxoSmithKline Research & Development, Research Triangle Park, North Carolina, U.S.A.
编辑推荐 Review
In the era of large systems embedded in a single system-on-chip (SOC) and fabricated continuously shrinking technologies, it is important to ensure correct behavior of the whole system. Electronic design and test engineers of today have to deal with these complex and heterogeneous systems (digital, mixed-signal, memory), but few have the possibility to study the whole field in a detailed and deep way. This book provides an extremely broad knowledge of the discipline, covering the fundamentals in detail, as well as the most recent and advanced concepts. Michel Renovell, Laboratoire d'Informatique, de Robotique et de Microelectronique de Montpellier (LIRMM), Montpellier, France This book combines in a unique way insight into industry practices commonly found in commercial DFT tools but not discussed in textbooks, and a sound treatment of the future fundamentals. The comprehensive review of future test technology trends, including self-repair, soft error protection, MEMS testing, and RF testing, leads students and researchers to advanced DFT research. Hans-Joachim Wunderlich, University of Stuttgart, Germany Recent advances in semiconductor manufacturing have made design for testability (DFT) an essential part of nanometer designs. I am pleased to find a DFT textbook of this comprehensiveness that can serve both academic and professional needs. Andre Ivanov, University of British Columbia, Canada This is the most recent book covering all aspects of digital systems testing. It is a "must read" for anyone focused on learning modern test issues, test research, and test practices. Kewal K. Saluja, University of Wisconsin-Madison By covering the basic DFT theory and methodology on digital, memory, as well as analog and mixed-signal (AMS) testing, this book stands out as one best reference book that equips practitioners with testable SOC design skills. Yihe Sun, Tsinghua University, Beijing, China
Review
In the era of large systems embedded in a single system-on-chip (SOC) and fabricated continuously shrinking technologies, it is important to ensure correct behavior of the whole system. Electronic design and test engineers of today have to deal with these complex and heterogeneous systems (digital, mixed-signal, memory), but few have the possibility to study the whole field in a detailed and deep way. This book provides an extremely broad knowledge of the discipline, covering the fundamentals in detail, as well as the most recent and advanced concepts.
Michel Renovell, Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier (LIRMM), Montpellier, France
This book combines in a unique way insight into industry practices commonly found in commercial DFT tools but not discussed in textbooks, and a sound treatment of the future fundamentals. The comprehensive review of future test technology trends, including self-repair, soft error protection, MEMS testing, and RF testing, leads students and researchers to advanced DFT research.
Hans-Joachim Wunderlich, University of Stuttgart, Germany
Recent advances in semiconductor manufacturing have made design for testability (DFT) an essential part of nanometer designs. I am pleased to find a DFT textbook of this comprehensiveness that can serve both academic and professional needs.
Andre Ivanov, University of British Columbia, Canada
This is the most recent book covering all aspects of digital systems testing. It is a "must read" for anyone focused on learning modern test issues, test research, and test practices.
Kewal K. Saluja, University of Wisconsin-Madison
By covering the basic DFT theory and methodology on digital, memory, as well as analog and mixed-signal (AMS) testing, this book stands out as one best reference book that equips practitioners with testable SOC design skills.
Yihe Sun, Tsinghua University, Beijing, China